Atomic layer deposition principles, characteristics, and nanotechnology applications

Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It cov...

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Detalles Bibliográficos
Autor principal: Kääriäinen, Tommi (-)
Otros Autores: Cameron, David, 1949-, Kääriäinen, Marja-Leena, Sherman, Arthur, 1931-
Formato: Libro electrónico
Idioma:Inglés
Publicado: Salem, Massachusetts : Hoboken, New Jersey : Scrivener Publishing, LLC [2013]
Edición:2nd edition
Colección:Wiley ebooks.
Acceso en línea:Conectar con la versión electrónica
Ver en Universidad de Navarra:https://innopac.unav.es/record=b4615324x*spi
Descripción
Sumario:Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It covers ALD's application to microelectronics (MEMS) and nanotechnology; many important new and emerging applications; thermal processes for ALD growth of nanometer thick films of semiconductors, oxides, metals and nitrides; and the formation of organic and hybrid materials.
Descripción Física:1 recurso electrónico
Formato:Forma de acceso: World Wide Web.
Bibliografía:Incluye referencias bibliográficas e índice.
ISBN:9781118747384
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9781118747346
9781118747407
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