Measurement techniques for radio frequency nanoelectronics

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...

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Detalles Bibliográficos
Otros Autores: Wallis, T. Mitch, 1974- autor (autor), Kaboš, P. (Pavel) autor
Formato: Libro electrónico
Idioma:Inglés
Publicado: Cambridge : Cambridge University Press 2017.
Colección:CUP ebooks.
The Cambridge RF and microwave engineering series.
Acceso en línea:Conectar con la versión electrónica
Ver en Universidad de Navarra:https://innopac.unav.es/record=b45481647*spi

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