Measurement techniques for radio frequency nanoelectronics

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...

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Detalles Bibliográficos
Otros Autores: Wallis, T. Mitch, 1974- autor (autor), Kaboš, P. (Pavel) autor
Formato: Libro electrónico
Idioma:Inglés
Publicado: Cambridge : Cambridge University Press 2017.
Colección:CUP ebooks.
The Cambridge RF and microwave engineering series.
Acceso en línea:Conectar con la versión electrónica
Ver en Universidad de Navarra:https://innopac.unav.es/record=b45481647*spi
Descripción
Sumario:Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
Descripción Física:1 recurso electrónico (xiv, 314 páginas)
Formato:Forma de acceso: World Wide Web.
ISBN:9781316343098