Focused Ion Beams
As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wid...
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| Formato: | |
| Idioma: | Inglés |
| Publicado: |
Cambridge, MA :
MyJoVE Corp
2016.
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| Colección: | JOVE Science Education.
Materials Engineering. |
| Acceso en línea: | Acceso a vídeo desde UNAV |
| Ver en Universidad de Navarra: | https://innopac.unav.es/record=b42109450*spi |
| Sumario: | As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB systems can be thought of as a beam of ions that can be used to mill (sputter), deposit, and image materials on micro- and nano-scales. The ion columns of FIBs are commonly integrated with the electron columns of scanning electron microscopes (SEMs). The goal of this experiment is to introduce the state of the art in focused ion beam technologies and to show how these instruments can be used in order to fabricate structures that are as small as the smallest membranes that are found in the human body. |
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| Notas: | Tít. sacado de la página de descripción del recurso. |
| Descripción Física: | 1 recurso electrónico (568 seg.) : son., col |
| Formato: | Forma de acceso: World Wide Web. |
| Público: | Para estudiantes universitarios, graduados y profesionales. |
