Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.
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| Formato: | |
| Idioma: | Inglés |
| Publicado: |
Cambridge, MA :
MyJoVE Corp
2016.
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| Colección: | JOVE Video Journal Biology and Medicine.
Biology. |
| Acceso en línea: | Acceso a vídeo desde UNAV |
| Ver en Universidad de Navarra: | https://innopac.unav.es/record=b42075294*spi |
| Sumario: | Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view. |
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| Notas: | Tít. sacado de la página de descripción del recurso. |
| Descripción Física: | 1 recurso electrónico (549 seg.) : son., col |
| Formato: | Forma de acceso: World Wide Web. |
| Público: | Para estudiantes universitarios, graduados y profesionales. |
