Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

Descripción completa

Detalles Bibliográficos
Autor Corporativo: SpringerLink (-)
Otros Autores: Vogt, Thomas (-), Dahmen, Wolfgang, Binev, Peter
Formato: Libro electrónico
Idioma:Inglés
Publicado: Boston, MA : Springer US 2012.
Colección:Nanostructure Science and Technology.
Springer eBooks.
Acceso en línea:Conectar con la versión electrónica
Ver en Universidad de Navarra:https://innopac.unav.es/record=b32977918*spi
Descripción
Sumario:Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Descripción Física:IX, 182 p.
Formato:Forma de acceso: World Wide Web.
ISBN:9781461421917