Monte Carlo modeling for electron microscopy and microanalysis

1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and I...

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Detalles Bibliográficos
Autor principal: Joy, David C., 1943- (-)
Formato: Libro electrónico
Idioma:Inglés
Publicado: New York : Oxford University Press 1995.
Colección:EBSCO Academic eBook Collection Complete.
Oxford series in optical and imaging sciences ; 9.
Acceso en línea:Conectar con la versión electrónica
Ver en Universidad de Navarra:https://innopac.unav.es/record=b31430685*spi
Descripción
Sumario:1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Descripción Física:viii, 216 p. : il
Formato:Forma de acceso: World Wide Web.
Bibliografía:Incluye referencias bibliográficas e índice.
ISBN:9780195358469