7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California

7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California

Bibliographic Details
Main Author: International Symposium on Quality Electronic Design (-)
Corporate Authors: International Symposium on Quality Electronic Design Corporate Author (corporate author), IEEE Electron Devices Society Content Provider (content provider), Components, Packaging & Manufacturing Technology Society Content Provider, IEEE Circuits and Systems Society Content Provider
Format: eBook
Language:Inglés
Published: [Place of publication not identified] : IEEE Computer Society 2006.
Series:ACM Conferences.
Subjects:
Integrated circuits > Reliability > Very large scale integration > Congresses
Integrated circuits > Very large scale integration > Design and construction > Congresses
Integrated circuits > Computer-aided design > Very large scale integration > Congresses
Integrated circuits > Testing > Quality control > Very large scale integration > Congresses
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009713985106719
Description
Item Description:Bibliographic Level Mode of Issuance: Monograph
ISBN:9781509094592

Similar Items