X-ray diffraction modern experimental techniques

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Detalles Bibliográficos
Otros Autores: Seeck, Oliver H., editor (editor)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Boca Raton, Florida : Pan Stanford Publishing 2014.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009633637906719
Descripción
Sumario:High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electr
Notas:Description based upon print version of record.
Descripción Física:1 online resource (438 p.)
Bibliografía:Includes bibliographical references at the end of each chapters.
ISBN:9780429071898
9789814303590