Soft errors from particles to circuits
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practi...
| Otros Autores: | , , |
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Boca Raton, Florida :
CRC Press
[2015]
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| Edición: | 1st edition |
| Colección: | Devices, circuits, and systems.
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| Materias: | |
| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009628877606719 |
| Sumario: | This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practical knowledge and state-of-the-art survey of instrumentation developments in the fields of environment characterization, particle detection, and real-time/accelerated soft error tests, as well as examines recent computational advances and modeling and simulation strategies for the soft error rate es |
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| Notas: | Description based upon print version of record. |
| Descripción Física: | 1 online resource (432 p.) |
| Bibliografía: | Includes bibliographical references. |
| ISBN: | 9781351831550 9781315215662 9781466590847 |
