VLSI test principles and architectures design for testability
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of i...
| Otros Autores: | , , |
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers
c2006.
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| Edición: | 1st edition |
| Colección: | Morgan Kaufmann series in systems on silicon.
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| Materias: | |
| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009627292406719 |
| Sumario: | This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.· |
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| Notas: | Description based upon print version of record. |
| Descripción Física: | 1 online resource (809 p.) |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9781280966842 9786610966844 9780080474793 |
