Transmission Electron Microscopy A Textbook for Materials Science
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance...
| Autor principal: | |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Boston, MA :
Springer US
2009.
|
| Edición: | 2nd ed |
| Colección: | Springer eBooks.
|
| Acceso en línea: | Conectar con la versión electrónica |
| Ver en Universidad de Navarra: | https://innopac.unav.es/record=b32975867*spi |
Tabla de Contenidos:
- Basics
- The Transmission Electron Microscope
- Scattering and Diffraction
- Elastic Scattering
- Inelastic Scattering and Beam Damage
- Electron Sources
- Lenses, Apertures, and Resolution
- How to ‘See’ Electrons
- Pumps and Holders
- The Instrument
- Specimen Preparation
- Diffraction
- Diffraction in TEM
- Thinking in Reciprocal Space
- Diffracted Beams
- Bloch Waves
- Dispersion Surfaces
- Diffraction from Crystals
- Diffraction from Small Volumes
- Obtaining and Indexing Parallel-Beam Diffraction Patterns
- Kikuchi Diffraction
- Obtaining CBED Patterns
- Using Convergent-Beam Techniques
- Imaging
- Amplitude Contrast
- Phase-Contrast Images
- Thickness and Bending Effects
- Planar Defects
- Imaging Strain Fields
- Weak-Beam Dark-Field Microscopy
- High-Resolution TEM
- Other Imaging Techniques
- Image Simulation
- Processing and Quantifying Images
- Spectrometry
- X-ray Spectrometry
- X-ray Spectra and Images
- Qualitative X-ray Analysis and Imaging
- Quantitative X-ray Analysis
- Spatial Resolution and Minimum Detection
- Electron Energy-Loss Spectrometers and Filters
- Low-Loss and No-Loss Spectra and Images
- High Energy-Loss Spectra and Images
- Fine Structure and Finer Details.
