Electronics reliability and measurement technology nondestructive evaluation
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
| Otros Autores: | |
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Park Ridge, N.J., U.S.A. :
Noyes Data Corp
1988.
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| Colección: | Science Direct e-books.
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| Acceso en línea: | Conectar con la versión electrónica |
| Ver en Universidad de Navarra: | https://innopac.unav.es/record=b3052927x*spi |
| Sumario: | This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots. |
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| Notas: | "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii. |
| Descripción Física: | 1 recurso electrónico (xii, 128 p.) : il |
| Bibliografía: | Incluye referencias bibliográficas e índice. |
| ISBN: | 9781591240518 9780815511717 9780815516996 9780815517009 9780080944685 |
