Characterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc

This Special Issue “Characterization of Nanomaterials” collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium “M...

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Detalles Bibliográficos
Otros Autores:	Zschech, Ehrenfried (Editor ), Sinclair, Robert (Otro), Martins, Rodrigo, Sebastiani, Marco, Sartori, Sabrina
Formato:	Libro electrónico
Idioma:	Inglés
Publicado:	Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
Materias:	Technology: general issues physical vapor deposition magnetron sputtering AlN/Al coating silicon substrate residual stresses wafer curvature method nanoscale residual stress profiling indentation failure modes nanoindentation adhesion intermetallic phases growth kinetics Al-Ni system zinc oxide nanoparticles paper transistors printed electronics electrolyte-gated transistors microwave synthesis oxide dissociation doping rare earth ions upconversion liquid alloys 2D materials thin films Ga-Sn-Zn alloys gallium alloys nanoanalysis lithium-ion nickel-manganese-cobalt oxide (NMC) leaching recycling recover degradation SEM-EDX Raman spectroscopy resistive switching memories multi-level cell copper oxide grain boundaries aluminum oxide p-type TFT p-type oxide semiconductors SnO electrical properties oxide structure analysis ToF-SIMS 3D imaging compositional depth profiling high aspect ratio (HAR) structures silicon doped hafnium oxide (HSO) ALD deposition lateral high aspect ratio (LHAR) ToF-SIMS analysis
Ver en Biblioteca Universitat Ramon Llull:	https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009654813606719