Test and measurement
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need...
| Otros Autores: | |
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Newnes/Elsevier
c2009.
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| Edición: | 1st edition |
| Colección: | Newnes know it all series.
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| Materias: | |
| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009627740206719 |
Tabla de Contenidos:
- Front cover; Test and Measurement; The Newnes Know It All Series; Copyright; Table of Contents; About the Authors; Part I: Measurement Technology and Techniques; Chapter 1: Fundamentals of Measurement; 1.1 Introduction; 1.2 Fundamental Concepts; 1.2.1 Measurand and Influence Quantity; 1.2.2 True Value (of a Quantity); 1.2.3 Nominal Value and Conventional True Value; 1.2.4 Error and Relative Error of Measurement; 1.2.5 Random Error; 1.2.6 Systematic Error; 1.2.7 Accuracy and Precision; 1.2.8 Calibration; 1.2.9 Hierarchy of Measurement Standards; 1.2.10 Traceability
- 1.2.11 Test Uncertainty Ratio1.2.12 Resolution, Discrimination, and Sensitivity; 1.2.13 Tolerance; 1.2.14 Repeatability of Measurements; 1.2.15 Reproducibility of Measurements; Bibliography; International Standards; Introductory Reading; Advanced Reading; Chapter 2: Sensors and Transducers; 2.1 Basic Sensor Technology; 2.1.1 Sensor Data Sheets; 2.1.2 Sensor Performance Characteristics Definitions; 2.1.2.1 Transfer Function; 2.1.2.2 Sensitivity; 2.1.2.3 Span or Dynamic Range; 2.1.2.4 Accuracy or Uncertainty; 2.1.2.5 Hysteresis; 2.1.2.6 Nonlinearity (Often Called Linearity); 2.1.2.7 Noise
- 2.1.2.8 Resolution2.1.2.9 Bandwidth; 2.1.3 Sensor Performance Characteristics of an Example Device; 2.1.3.1 Transfer Function; 2.1.3.2 Sensitivity; 2.1.3.3 Dynamic Range; 2.1.3.4 Hysteresis; 2.1.3.5 Temperature Coefficient; 2.1.3.6 Linearity; 2.1.3.7 Noise; 2.1.3.8 Resolution; 2.1.3.9 Bandwidth; 2.1.4 Introduction to Sensor Electronics; 2.1.5 Types of Sensors; 2.1.5.1 Resistive Sensor Circuits; 2.1.5.2 Capacitance measuring circuits; 2.1.5.3 Inductance Measurement Circuits; 2.1.6 Sensor Limitations; 2.1.6.1 Limitations in Resistance Measurement
- 2.1.6.2 Limitations to Measurement of Capacitance2.1.7 Filters; 2.1.8 Operational Amplifiers; 2.2 Sensor Systems; 2.3 Application Considerations; 2.4 Sensor Characteristics; 2.5 System Characteristics; 2.6 Instrument Selection; 2.6.1 Sensor; 2.6.2 Cable; 2.6.3 Power Supply; 2.6.4 Amplifier; 2.7 Data Acquisition and Readout; 2.8 Installation; 2.8.1 Sensor; 2.8.2 Cement Mounting; 2.8.3 Cable; 2.8.4 Power Supply, Amplifier, and Readout; 2.9 Measurement Issues and Criteria; Chapter 3: Data Acquisition Hardware and Software; 3.1 ADCs; 3.1.1 Reference Voltage; 3.1.2 Output Word; 3.1.3 Resolution
- 3.2 Types of ADCs3.2.1 Tracking ADC; 3.2.2 Flash ADC; 3.2.3 Successive Approximation Converter; 3.2.4 Dual-Slope (Integrating) ADC; 3.2.5 Sigma-Delta; 3.2.6 Half-Flash; 3.3 ADC Comparison; 3.4 Sample and Hold; 3.5 Real Parts; 3.5.1 Input Levels; 3.5.2 Internal Reference; 3.5.3 Reference Bypassing; 3.5.4 Internal S/H; 3.6 Microprocessor Interfacing; 3.6.1 Output Coding; 3.6.2 Parallel Interfaces; 3.6.3 Data Access Time; 3.6.4 -BUSY Output; 3.6.5 Bus Relinquish; 3.6.6 Coupling; 3.6.7 Delay between Conversions; 3.6.8 LSB Errors; 3.7 Clocked Interfaces; 3.8 Serial Interfaces; 3.8.1 SPI/Microwire
- 3.8.2 I2C Bus
